Quote on IAW 156-0067-00 of National Semiconductor Corporation with NSN 5962010107442

Part Number: IAW 156-0067-00

Alternate P/N: IAW156006700

Manufacturer: National Semiconductor Corporation

NSN: 5962-01-010-7442

NIIN: 010107442

Item Name : Microcircuit Linear

CAGE Code: 27014

FSC: 5962 Microcircuits Electronic

FSG: 59 Electrical and Electronic Equipment Components

Country: USA

NCB Code: 01

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At Vital Purchasing, we prioritize providing our customers with only the highest quality NSN parts and services. As such, we proudly source all of our components such as part number IAW 156-0067-00 from leading manufacturers like National Semiconductor Corporation, an entity that operates with CAGE Code 27014. More than that, we subject countless items to thorough quality assurance measures to guarantee their caliber prior to purchase, and we boast a global supply-chain network that allows us to expedite shipping times for both domestic and international orders to accommodate those with rigid time constraints. Begin the procurement process for all the FSC 5962 Microcircuits Electronic related parts you require today to see how we can simplify part sourcing for you.

NSN Information for Part Number IAW 156-0067-00 with NSN 5962-01-010-7442, 5962010107442

NSN	FSC	NIIN	CLS	Hazmat	DEMIL	Cancelled NSN
5962-01-010-7442 Item PartTypeName: MICROCIRCUIT,LINEAR	5962	010107442		N	B
	CIIC	HCC	ESD	PMIC	Criticality	ENAC
			B	U	0
Part Number	ISC	RNVC	RNCC	HCC	MSDS	SADC
MICROA741CP	1	2	5

Characteristics Data of NSN 5962-01-010-7442, 5962010107442

MRC	Criteria	Characteristic
ADAQ	BODY LENGTH	0.363 INCHES MINIMUM AND 0.393 INCHES MAXIMUM
ADAT	BODY WIDTH	0.236 INCHES MINIMUM AND 0.256 INCHES MAXIMUM
ADAU	BODY HEIGHT	0.130 INCHES MINIMUM AND 0.150 INCHES MAXIMUM
AEHX	MAXIMUM POWER DISSIPATION RATING	500.0 MILLIWATTS
AFGA	OPERATING TEMP RANGE	0.0/80.0 DEG CELSIUS
AFJQ	STORAGE TEMP RANGE	-55.0/125.0 DEG CELSIUS
CBBL	FEATURES PROVIDED	MONOLITHIC AND NEGATIVE OUTPUTS AND POSITIVE OUTPUTS AND HIGH GAIN AND ADJUSTABLE
CQSJ	INCLOSURE MATERIAL	CERAMIC OR PLASTIC
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE
CQZP	INPUT CIRCUIT PATTERN	2 INPUT
CWSG	TERMINAL SURFACE TREATMENT	TIN
CZEQ	TIME RATING PER CHACTERISTIC	300.00 NANOSECONDS NOMINAL PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT
TEST	TEST DATA DOCUMENT	80009-156-0067-00 DRAWING (THIS IS THE BASIC GOVERNING DRAWING,SUCH AS A CONTRACTOR DRAWING,ORIGINAL EQUIPMENT MANUFACTURER DRAWING,ETC.; EXCLUDES ANY SPECIFICATION,STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING